14 June 2012 | Print page |
Advanced microscopes for high-resolution and infrared imaging showcased at the Optatec show 2012 in Frankfurt, Germany. AVT provides Manta and Goldeye cameras.
Omek Optics of Israel exhibited at the Optatec Show in Frankfurt, Germany from May 22-25, 2012. The innovative supplier of high-end industrial microscopes teamed up with Allied Vision Technologies to demonstrate the capabilities of its low-distortion imaging optics for industrial inspection of microelectronics components.
Headquartered in Givat Ella, Israel, Omek Optics designs and manufactures high-end industrial microscopes with low-distortion optics and bright-field uniform and symmetric Kohler-type telecentric illumination. Main application areas are the inspection of electronic devices and components such as wafers, flat panel displays, LEDs and printed circuit boards.
High-resolution at low magnification
Omek microscopes stand out from the crowd with their ability to deliver high-resolution images at low magnification, yielding ultra wide fields of view. For example, the Mic401ET microscope features a high-resolution short focal length tube lens that supports digital cameras with up to 1 inch sensor format.
At Optatec, Omek Optics showcased two setups of their 300 and 400 series microscopes for semiconductor wafer inspection.
An Omek Mic 401ET microscope fitted with an AVT Manta G-504 CCD camera demonstrated the combination of low magnification microscopy with a high-resolution camera. The demo setup showed a CCD wafer inspected at 2x or 4x magnifications with a 5-megapixel camera. The Manta G-504 features a 2/3” ICX655 CCD sensor from Sony with 2452 x 2056 Pixels resolution. Thanks to the high-resolution tube lens of the Omek microscope (80 mm focal length), the full resolution of the sensor can be used, delivering high-resolution images for best-in-class details.
Infrared microscopy reveals hidden details
Omek Optics also showcased on their booth an Omek Mic303 microscope combined with an AVT Goldeye P-032 short-wave infrared camera used to inspect the same CCD wafer. Using infrared imaging makes it possible to see through the silicon and inspect metallic components located on the back side of the chip.
“We are very satisfied with our co-operation with Allied Vision Technologies”, commented Shai Eisenberg, CEO of Omek Optics. “With a wide choice of sensors in various resolutions both in the visible and infrared spectrum, AVT cameras are the perfect complement to Omek microscopes. Together, Omek microscopes and AVT cameras offer users high quality images for demanding industrial applications”.
Jochen Braun, Director International Sales EMEA at Allied Vision Technologies, is also delighted with the success of the partnership between both companies. “We are particularly proud that a high-end microscopy supplier like Omek selected AVT as a partner for digital cameras. We see this as an acknowledgment of our commitment to high quality and reliability for demanding industrial applications both in the visible and infrared area”.